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Reconstructing grain-shape statistics from electron back-scatter diffraction microscopy
R. Farr, Z. Vukmanovic, M. Holness, E. Griffiths
Physical Review Materials
210 views
#EBSD #ElectronMicroscopy #Materials
topic-1 (Extreme materials)
Electron-phonon coupling and the metalization of solid helium at terapascal pressures
B. Monserrat, N. Drummond, C. Pickard, R. Needs
Physical Review Letters
242 views
#materials #highpressure #condensedmatter
topic-1 (Extreme materials)
Predicting interface structures: from SrTiO 3 to graphene
G. Schusteritsch, C. Pickard
Physical Review B
186 views
#materials #graphene #densityfunctionaltheory
topic-1 (Extreme materials)
Random close packing fractions of lognormal distributions of hard spheres
R. Farr
Powder Technology
251 views
#fractal #spherepacking #materials
topic-1 (Extreme materials)
Diffusional Monte Carlo model of liquid-phase sintering
A. R.S.Farr
Mathematics and Computers in Simulation
214 views
#sintering #diffusion #materials
topic-1 (Extreme materials)
120 papers
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Reconstructing grain-shape statistics from electron back-scatter diffraction microscopy
R. Farr, Z. Vukmanovic, M. Holness, E. Griffiths
Physical Review Materials
2, 073804 (07/18)
A full, three-dimensional analysis of the shapes of grains in polycrystalline materials, such as rocks or ceramics, is difficult and costly. Here, the authors describe an approach that takes electron microscopy images of plane sections (together with crystal orientation data from the back-scattered electrons), and allows one to deduce information about the size and shape distribution of the randomly-oriented three-dimensional grains. The authors also provide an estimate of how much data is needed to achieve a certain level of confidence. Since this type of microscopy and image analysis is a highly effective and optimised technique, the new result promises to give much easier access to the three dimensional structures of many crystalline materials.
Synopsis: Grain Properties in a Single Shot
Reconstructing grain-shape statistics from electron back-scatter diffraction microscopy
APS Physics, 2018-07-31